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Characterization of the interface adhesion of dissimilar materials by a pressured blister test analyzed model considering substrate effect

主办单位:银河娱乐,银河娱乐官网下载物理力学专业委员会;中国科学院力学研究所;银河娱乐,银河娱乐官网下载办公室
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作者:L.M.Jiang;Y.C.Zhou
摘要:The pressurized blister test is a very convenient technique to measure the adhesion energy between the thin film and the substrate. In this paper, the interface adhesion energy considering the substrate effect for an elastic film/substrate system was stud
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